Mineralogy/petrology/economic geology facilities and equipment

  • Edward L. Clark Museum of Missouri Geology
  • Modern Nikon, Leitz, Leica, Zeiss, and Vickers petrographic and reflected light microscopes, some with differential interference contrast
  • Digital cameras and video recorder systems
  • Zeiss Microscope Reflectance Photometer (MPMOIK)
  • Research Devices infrared microscope  
  • Cathodoluminescence microscope system (Technosyn 8200 MkII and Nuclide ELM-2)  
  • Heating and freezing fluid inclusion stages (Fluid Inc. and Chaix Meca)  
  • Ultraviolet Fluorescence microscope  
  • Rigaku Miniflex x-ray diffractometer system with six-position sample interchange and Jade spectra software analysis system  
  • Perkin-Elmer Elan DRC-e Inductively Coupled Plasma/Mass Spectrometer (ICP/MS) with autosampler
  • Perkin-Elmer Optima 2000 DV Inductively Coupled Plasma/Optical Emission Spectrometer (ICP/OES), ultrasonic nebulizer, dual view optics, and autosampler  
  • Newwave-Merchantek 213 nm laser ablation system for use with solid phase analysis with either the ICP/MS or ICP/OES systems 

The Graduate Center for Materials Research provides extensive equipment and full-time staff for solid phase analysis and microanalysis of materials. Equipment includes:

  • Philips EM430T Scanning Transmission Electron Microscope (STEM) equipped with back-scattered electron imagery and dispersive spectrometer 
  • JEOL T330A, Hitachi S-4700 FESEM, and Hitachi S570 scanning electron microscopes (SEM) equipped with back-scattered electron imagery and wavelength dispersive spectrometer 
  • Fully automated Scintag PAD V X-ray diffractometer and Scintag system computer processor and X-ray data library  
  • Kratos Axis 165 X-ray Photoelectron Spectrometer  
  • Physical Electronics Model 545 Auger Microprobe  
  • Atomic Force Microscope  
  • Thermogravimetric (TGA), Differential Thermal Analysis (DTA)  
  • Differential Scanning Calorimetry (DSC)  
  • Nuclear Magnetic Resonance Imaging (NMR) 

The Environmental and Emerging Contaminants Research Center provides extensive equipment and full-time staff for analysis of trace and minor elements. Equipment includes:

  • Perkin Elmer graphite furnace and flame atomic absorption spectrometers  
  • Hydride Atomic Absorption Spectrometer  
  • Shimadzu total carbon analyzers  
  • Perkin Elmer 8500 Gas Chromatography - Fourier Transform IR Spectrometer  
  • Hewlett Packard- 5972 Quadrapole Mass Spectrometer  
  • Perkin-Elmer HPLC 

Facilities and equipment within other departments:

  • Philips X-Pert X-Ray diffraction (XRD)
  • PANalytical X’Pert Pro Multipurpose Diffractometer (MPD)
  • Tecnai F20 Transmission Electron Microscope (STEM) equipped with back-scattered electron imagery and dispersive spectrometer
  • Philips EM430T Scanning Transmission Electron Microscope (STEM)
  • Hitachi S-4700 Field Emission Scanning Electron Microscope (FESEM)
  • Hitachi S-570 SEM
  • Perkins Elmer Elan DRCe Inductively Coupled Plasma-Mass Spectrometer (ICP-MS)
  • Perkins Elmer 2000D Series Inductively Coupled Plasma-Optical Emission Spectrometer (ICP-OES) with liquid autosampler